ASTM E930 PDF

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A number in parentheses indicates the year of last reapproval. This standard has been approved for use by agencies of the U. Department of Defense. The methods presented here are for use when the number of large grains is too few formeasurement by Test Methods E It shall be understood that larger but unobserved grains mayexist in the local volume sampled.

It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use. Referenced Documents2. Significance and Use4. Thus there is engi-neering justification for reporting the ALA grain size.

Atypical example is shown in AnnexA1 as Fig. Current edition approved Oct. Published November Originallyapproved in Last previous edition approved in as E — 99 Order Adjunct No. United States For greater accuracy, a measuring proce-dure is described in 6. Amanual quantitative method, to serveas referee procedure, is described in 6. Examples of visual aids are shown inAnnex A2, with their specifications in Annex A3.

NOTE 1—The use of Test Methods E comparison plates is notallowed, since few of the grain sections illustrated correspond to theaverage area for that grain size number.

Usethe nearest area in the table to obtain the ALA grain sizenumber, unless the next smaller or the next larger area is agreedupon between the interested parties.

NOTE 2—Any automatic or semiautomatic measuring device whichprovides the area of a grain section can also be used within the frameworkof this manual method. In caseof uncertainty about which of several grain sections is thelargest, photograph them all and carry out the following stepsfor all of the photographs. An interline grid spacing of 5mm is recommended.

Count the number of grid intersections points that fall within the large grain being estimated. Pointsfalling on the grain boundary are counted as one half. Use the nearest area in the table to report the ALAgrain size number, unless the next smaller or the next largerarea is agreed upon between the interested parties. Precision and Bias7. Users of this standard are expressly advised that determination of the validity of any such patent rights, and the riskof infringement of such rights, are entirely their own responsibility.

This standard is subject to revision at any time by the responsible technical committee and must be reviewed every five years andif not revised, either reapproved or withdrawn. Your comments are invited either for revision of this standard or for additional standardsand should be addressed to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of theresponsible technical committee, which you may attend.

If you feel that your comments have not received a fair hearing you shouldmake your views known to the ASTM Committee on Standards, at the address shown below.

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